Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning
Published in CVPR, 2022
Recommended citation: Yuan-Fu Yang and Min Sun, "Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning", 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), New Orleans, LA, USA, 2022, pp. 2313-2322, doi: 10.1109/CVPR52688.2022.00236 https://ieeexplore.ieee.org/document/9879978
With the rapid development of artificial intelligence and autonomous driving technology, the demand for semiconductors is projected to rise substantially. However, the massive expansion of semiconductor manufacturing and the development of new technology will bring many defect wafers. If these defect wafers have not been correctly inspected, the ineffective semiconductor processing on these defect wafers will cause additional impact to our environment, such as excessive carbon dioxide emission and energy consumption. In this paper, we utilize the information processing advantages of quantum computing to promote the defect learning defect review (DLDR). We propose a classical-quantum hybrid algorithm for deep learning on near-term quantum processors. By tuning parameters implemented on it, quantum circuit driven by our framework learns a given DLDR task, include of wafer defect map classification, defect pattern classification, and hotspot detection. In addition, we explore parametrized quantum circuits with different expressibility and entangling capacities. These results can be used to build a future roadmap to develop circuit-based quantum deep learning for semiconductor defect detection.
Recommended citation: Yuan-Fu Yang and Min Sun, “Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning”, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), New Orleans, LA, USA, 2022, pp. 2313-2322, doi: 10.1109/CVPR52688.2022.00236