CV

Education

Ph.D in College of Electrical Engineering and Computer Science, National Tsing Hua University
M.S. in Industrial and System Engineering, Chung Yuan Christian University

2023 TSMC ESG Competition Best Award
2023 CVPR (Vancouver) TechArt Piece Selected for Exhibition
2022 TSMC Collaboration for Internal Control Excellence Symposium First Award
2021 Linz Electronic Arts Festival (Austria) TechArt Piece Selected for Exhibition.
2021 National Tsing Hua University International Paper Best Award
2020 SEMI Advanced Semiconductor Manufacturing Conference Best Paper Award
2020 TSMC Machine Learning Competition First Runner-up
2018 TSMC Kaggle Competition First Award
2011, 2015, 2016 TSMC CIT Competition Frist Award
2011, 2016 TSMC Annual First Award

2024 -: Institute of Artificial Intelligence Innovation, NYCU
- Assistant Professor
2020 - 2023: Chief Engineering, Machine Learning Dept, TSMC
- Create data-driven solutions to semiconductor operations problems (e.g. defect detection, fail rate analysis) across a variety of department using machine learning and statistics
- Used EDA, statistical tools, machine learning modeling algorithms and model performance tools for creating a backend model to estimate control wafer fail rate
- Develop AIOps for IT Operations, focuses on analyzing and prioritizing millions of events on K8S
- Developed and deployed deep learning models for object detection
2015 - 2019: Supervisor, MEP Dept, TSMC
- Design a dashboard, a frontend UI development, as a visualization tool for the user
- Responsible for the planning and re-designing the internal work flow of the semiconductor manufacturing line. Achieved a productivity improvement of 40% with a auto workflow built in Web UI
- Wrote simulations to study the sensitivity of equipment productivity
- Use a variety of Big Data tools to analyse semiconductor process history and solve the system problem in foundry.

2017 - 2023: Quality & Reliability, TSMC
- Member of CIT Competition Juror
2022 - now: Reviewer
- Computer Vision and Pattern Recognition Conference (CVPR)
- International Conference on Computer Vision (ICCV)
- IEEE Transactions on Neural Networks and Learning Systems (TNNLS)
- IEEE Transactions on Instrumentation and Measurement (TIM)